Brightness analysis of an electron beam with a complex profile

We propose a novel analysis method to obtain the core bright part of an electron beam with a complex phase-space profile. This method is beneficial to evaluate the performance of simulation data of a linear accelerator (linac), such as an x-ray free electron laser (XFEL) machine, since the phase-spa...

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Bibliographic Details
Published inPhysical review. Accelerators and beams Vol. 21; no. 5; p. 050703
Main Authors Maesaka, Hirokazu, Hara, Toru, Togawa, Kazuaki, Inagaki, Takahiro, Tanaka, Hitoshi
Format Journal Article
LanguageEnglish
Published College Park American Physical Society 01.05.2018
Subjects
Brightness
Electron beams
Electrons
Free electron lasers
Gaussian beams (optics)
Linear accelerators
Performance evaluation
Simulation
Synchrotrons
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Summary:We propose a novel analysis method to obtain the core bright part of an electron beam with a complex phase-space profile. This method is beneficial to evaluate the performance of simulation data of a linear accelerator (linac), such as an x-ray free electron laser (XFEL) machine, since the phase-space distribution of a linac electron beam is not simple, compared to a Gaussian beam in a synchrotron. In this analysis, the brightness of undulator radiation is calculated and the core of an electron beam is determined by maximizing the brightness. We successfully extracted core electrons from a complex beam profile of XFEL simulation data, which was not expressed by a set of slice parameters. FEL simulations showed that the FEL intensity was well remained even after extracting the core part. Consequently, the FEL performance can be estimated by this analysis without time-consuming FEL simulations.
ISSN:2469-9888
2469-9888
DOI:10.1103/PhysRevAccelBeams.21.050703