Thickness Effect on the Structural and Electrical Properties of Sputtered YBCO Coated Conductors
In this paper we studied the structural and electrical properties variations with the thickness of YBa 2 Cu 3 O 7-X (YBCO) film. In our experiments, the critical current density (Jc) has a maximum at 1.2 micron rather than monotonically decreased with increasing film thickness. The in-plane and out-...
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Published in | IEEE transactions on applied superconductivity Vol. 21; no. 3; pp. 2945 - 2948 |
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Main Authors | , , , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
New York, NY
IEEE
01.06.2011
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | In this paper we studied the structural and electrical properties variations with the thickness of YBa 2 Cu 3 O 7-X (YBCO) film. In our experiments, the critical current density (Jc) has a maximum at 1.2 micron rather than monotonically decreased with increasing film thickness. The in-plane and out-plane alignments of the films, measured with X-ray Diffraction Omega-scan and Phi-scan, were poor at the beginning stage of the deposition and then became better as the film thickness increased.The surfaces of different samples also change a lot while films less than 700 nm in thickness. Under optimized deposition conditions, biaxial textured YBCO films have been obtained, with the full width at half maximum being 2.1° and 4.5° for out-of-plane and in-plane orientations respectively, Jc greater than 1.2 MA/cm 2 at 77 K, self field. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/TASC.2010.2090439 |