Quantitative Characterization of Partial Dislocations in Nanocrystalline Metals

Partial dislocations in nanocrystalline metals are introduced and a modified dislocation density formula for partial dislocations is established by x-ray line profile analysis theories. Effects of factors on the determination of partial dislocation density are discussed. From the correlation between...

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Bibliographic Details
Published inChinese physics letters Vol. 27; no. 5; pp. 174 - 177
Main Author 倪海涛 张喜燕 朱玉涛
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.05.2010
Subjects
Correlation
Dislocation density
Dislocations
Mathematical analysis
Nanocrystals
Nickel
X-rays
X射线
位错密度
偏相关
分析理论
定量表征
纳米晶
纳米金属
评价方法
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ISSN0256-307X
1741-3540
DOI10.1088/0256-307X/27/5/056101

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Summary:Partial dislocations in nanocrystalline metals are introduced and a modified dislocation density formula for partial dislocations is established by x-ray line profile analysis theories. Effects of factors on the determination of partial dislocation density are discussed. From the correlation between the partial and perfect dislocations, partial dislocation density is simply quantitative characterized by drawing on the evaluation methodology of perfect dislocations. Dislocation densities of nanocrystalfine nickel calculated from two different equations are compared additionally.
Bibliography:11-1959/O4
TG335.12
TB383
ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/27/5/056101