Multiple-carrier-lifetime model for carrier dynamics in InGaN/GaN LEDs with a non-uniform carrier distribution

• Published in: Journal of applied physics Vol. 135; no. 3
• Main Authors: Li, Xuefeng, DeJong, Elizabeth, Armitage, Rob, Feezell, Daniel
• Format: Journal Article
• Language: English
• Published: Melville American Institute of Physics 21.01.2024; American Institute of Physics (AIP)
• Subjects: Applied physics; Carrier density; Carrier recombination; Charge recombination; Electroluminescence; ENGINEERING; Frequency modulation; Lifetime; Light emitting diodes; Quantum efficiency; Quantum wells
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/5.0184456

We introduce a multiple-carrier-lifetime model (MCLM) for light-emitting diodes (LEDs) with non-uniform carrier distribution, such as in multiple-quantum-well (MQW) structures. By employing the MCLM, we successfully explain the modulation response of V-pit engineered MQW LEDs, which exhibit an S21 roll-off slower than −20 dB/decade. Using the proposed model and employing a gradient descent method, we extract effective recombination and escape lifetimes by averaging the carrier behavior across the quantum wells. Our results reveal slower effective carrier recombination and escape in MQW LEDs compared with LEDs emitting from a single QW, indicating the advantages of lower carrier density achieved through V-pit engineering. Notably, the effective carrier recombination time is more than one order of magnitude lower than the effective escape lifetime, suggesting that most carriers in the quantum wells recombine, while the escape process remains weak. To ensure the reliability and robustness of the MCLM, we subject it to a comprehensive threefold validation process. This work confirms the positive impact of spreading carriers into several quantum wells through V-pit engineering. In addition, the MCLM is applicable to other LEDs with a non-uniform carrier distribution, such as micro-LEDs with significant surface recombination and non-uniform lateral carrier profiles.