Electric Field Vector Mapping in Sphere-to-Plane Electrode System using Simultaneous Three-Direction Optical Measurement System

• Published in: Japanese Journal of Applied Physics Vol. 40; no. 2R; p. 914
• Main Authors: Haruo Ihori, Haruo Ihori, Takao Kawasaki, Takao Kawasaki, Kotaro Tanino, Kotaro Tanino, Masaharu Fujii, Masaharu Fujii, Kiyomitsu Arii, Kiyomitsu Arii
• Format: Journal Article
• Language: English
• Published: 2001
• ISSN: 0021-4922; 1347-4065
• DOI: 10.1143/JJAP.40.914

We have investigated nonuniform electric field vector distributions in liquid dielectrics. We have already reported on measurements of symmetrical and nonsymmetrical electric field vector distribution using the Kerr electrooptic effect and our unique reconstruction method based on the computed tomography technique. For the measurement of a field vector distribution, it was necessary to measure light intensity twice by changing the optical axis of optical wedges. Moreover, the intensity measurement had to be carried out at many points around the electrode system, and therefore it took considerable time to measure an electric field distribution. Thus, we developed a simultaneous three-direction optical measurement system with three optical systems combined with a two-beam method. Using the new measurement system, the electric field vector distribution was measured in about 0.1 min.