High-performance extended short-wavelength infrared PBn photodetectors based on InAs/GaSb/AlSb superlattices

High performance short-wavelength infrared PBn photodetectors based on InAs/GaSb/AlSb superlattices on GaSb substrate have been demonstrated. At 300 K, the device exhibits a 50% cut-off wavelength of ∼ 2.1 μm as predicted from the band structure calculation; the device responsivity peaks at 0.85 A/W...

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Published inChinese physics B Vol. 32; no. 3; pp. 38503 - 676
Main Authors Jiang, Junkai, Chang, Faran, Zhou, Wenguang, Li, Nong, Chen, Weiqiang, Jiang, Dongwei, Hao, Hongyue, Wang, Guowei, Wu, Donghai, Xu, Yingqiang, Niu, Zhi-Chuan
Format Journal Article
LanguageEnglish
Published Chinese Physical Society and IOP Publishing Ltd 01.03.2023
Center of Materials Science and Optoelectronics Engineering,College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 100049,China
College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 101408,China
State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
College of Materials Science and Opto-Electronic Technology,University of Chinese Academy of Sciences,Beijing 101408,China%State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China%State Key Laboratory for Superlattices and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China
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Summary:High performance short-wavelength infrared PBn photodetectors based on InAs/GaSb/AlSb superlattices on GaSb substrate have been demonstrated. At 300 K, the device exhibits a 50% cut-off wavelength of ∼ 2.1 μm as predicted from the band structure calculation; the device responsivity peaks at 0.85 A/W, corresponding to a quantum efficiency (QE) of 56% for 2.0 μm-thick absorption region. The dark current density of 1.03 × 10 −3 A/cm 2 is obtained under 50 mV applied bias. The device exhibits a saturated dark current shot noise limited specific detectivity ( D *) of 3.29 × 10 10 cm⋅Hz 1/2 /W (at a peak responsivity of 2.0 μm) under –50 mV applied bias.
ISSN:1674-1056
DOI:10.1088/1674-1056/acaa2e