Near-Field Millimeter-Wave Imaging of Exposed and Covered Fatigue Cracks

In this paper, the efficacy of near-field millimeter-wave nondestructive techniques, using open-ended flange-mounted rectangular waveguide probes, for extracting information of 3-D crack area deformation (i.e., in-plane and out-of-plane deformation) is demonstrated. It is shown that this information...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 58; no. 7; pp. 2367 - 2370
Main Authors Kharkovsky, S., Ghasr, M.T., Zoughi, R.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.07.2009
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Covering
Crack
Crack propagation
Deformation
Effectiveness
Electromagnetic waveguides
Exposure
Fatigue
Fatigue failure
Flanges
imaging
Instrumentation
interference pattern
Millimeter wave technology
millimeter waves
near field
nondestructive
Optical surface waves
Optical waveguides
Probes
Rectangular waveguides
reflectometer
Reflectometers
Surface cracks
Surface waves
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Summary:In this paper, the efficacy of near-field millimeter-wave nondestructive techniques, using open-ended flange-mounted rectangular waveguide probes, for extracting information of 3-D crack area deformation (i.e., in-plane and out-of-plane deformation) is demonstrated. It is shown that this information can be obtained from indications of unique interference patterns that are generated between the probe and the metal surface during the raster scan of a surface-breaking exposed and covered fatigue crack using a phase-sensitive reflectometer.
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ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2009.2022380