Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures
We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the...
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Published in | Applied optics (2004) Vol. 41; no. 13; p. 2521 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
United States
01.05.2002
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Online Access | Get more information |
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Summary: | We propose a matrix method for the description of light reflection and transmission by an anisotropic multilayer system consisting of thin and thick layers. A method based on partial-wave matrix summations is applicable in the field of reflection and transmission photometry and ellipsometry. In the case of a thin anisotropic film, the interference effects were described by use of a coherent summation of Jones matrices. Incoherent intensity summations for a thick weakly anisotropic layer were characterized by use of the coherency vector formalism. Observable quantities or Mueller matrix components were obtained from the matrix describing transformation of the coherence vectors. |
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ISSN: | 1559-128X |
DOI: | 10.1364/ao.41.002521 |