Ultrahigh on/off -Current Ratio for Resistive Memory Devices With Poly(N-Vinylcarbazole)/Poly(3, 4-Ethylenedioxythiophene)-Poly(Styrenesulfonate) Stacking Bilayer

An ultrahigh ON/OFF-current ratio of 5 × 10 9 is presented in a resistive memory device using Au nanoparticles (Au NPs)-incorporated poly(N-vinylcarbazole) (PVK) and poly(3, 4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT-PSS) stacking configurations as the active layer and Al as electrodes...

Full description

Saved in:
Bibliographic Details
Published inIEEE electron device letters Vol. 32; no. 3; pp. 387 - 389
Main Authors Lai, Pei Ying, Chen, Jen-Sue
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.03.2011
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:An ultrahigh ON/OFF-current ratio of 5 × 10 9 is presented in a resistive memory device using Au nanoparticles (Au NPs)-incorporated poly(N-vinylcarbazole) (PVK) and poly(3, 4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT-PSS) stacking configurations as the active layer and Al as electrodes for nonvolatile-memory application. The investigation also suggests that the enhancement of the ON/OFF-current ratio cannot be achieved by simply increasing the thickness of the PVK: Au NPs layer itself. This PVK:Au-NPs/PEDOT-PSS stacking-bilayer memory device also demonstrates good retention of high ON/OFF-current ratio for at least 2 h and remains programmable at 125°C.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2010.2099102