Advanced fractal analysis of nanoscale topography of Ag/DLC composite synthesized by RF-PECVD
We present an advanced image analysis study of the 3D surfaces of silver/diamond-like carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical vapour deposition. Atomic force microscopy data were analysed, with the goal to provide image analysis tools allowing for a better und...
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| Published in | Surface engineering Vol. 36; no. 7; pp. 713 - 719 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
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London, England
Taylor & Francis
02.07.2020
SAGE Publications |
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| Abstract | We present an advanced image analysis study of the 3D surfaces of silver/diamond-like carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical vapour deposition. Atomic force microscopy data were analysed, with the goal to provide image analysis tools allowing for a better understanding of the structure-property correlation, with specific case for the present material. While the samples' fractal dimension decreased and the roughness increased with increasing deposition time, fractal succolarity showed no significant difference and relatively high values, describing high percolation, and fractal lacunarity decreased, in agreement with topographic entropy, which revealed uniformity in height distribution. In conclusion, the samples' microtexture shows a nearly uniform surface with a homogenous distribution of nanoparticles, due to the fabrication process and the emerging fractal nature of the nanocomposite, at all the considered deposition times. Fractal lacunarity and succolarity, currently not provided by commercial image analysis programmes, can be useful in advanced surface image characterization. |
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| AbstractList | We present an advanced image analysis study of the 3D surfaces of silver/diamond-like carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical vapour deposition. Atomic force microscopy data were analysed, with the goal to provide image analysis tools allowing for a better understanding of the structure-property correlation, with specific case for the present material. While the samples' fractal dimension decreased and the roughness increased with increasing deposition time, fractal succolarity showed no significant difference and relatively high values, describing high percolation, and fractal lacunarity decreased, in agreement with topographic entropy, which revealed uniformity in height distribution. In conclusion, the samples' microtexture shows a nearly uniform surface with a homogenous distribution of nanoparticles, due to the fabrication process and the emerging fractal nature of the nanocomposite, at all the considered deposition times. Fractal lacunarity and succolarity, currently not provided by commercial image analysis programmes, can be useful in advanced surface image characterization. |
| Author | Pinto, Erveton Pinheiro Matos, Robert Saraiva Salerno, Marco Ţălu, Ştefan Abdolghaderi, Senour |
| Author_xml | – sequence: 1 givenname: Ştefan orcidid: 0000-0003-1311-7657 surname: Ţălu fullname: Ţălu, Ştefan organization: Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI) – sequence: 2 givenname: Senour surname: Abdolghaderi fullname: Abdolghaderi, Senour organization: Department of Education – sequence: 3 givenname: Erveton Pinheiro orcidid: 0000-0002-4927-0883 surname: Pinto fullname: Pinto, Erveton Pinheiro organization: Physics Department, Federal University of Amapá, Amazonian Materials Group – sequence: 4 givenname: Robert Saraiva orcidid: 0000-0002-1219-8646 surname: Matos fullname: Matos, Robert Saraiva organization: Materials Engineering Department, Federal University of Sergipe – sequence: 5 givenname: Marco orcidid: 0000-0003-4522-828X surname: Salerno fullname: Salerno, Marco email: marco.salerno@iit.it organization: Materials Characterization Facility, Istituto Italiano di Tecnologia |
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| Title | Advanced fractal analysis of nanoscale topography of Ag/DLC composite synthesized by RF-PECVD |
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