Advanced fractal analysis of nanoscale topography of Ag/DLC composite synthesized by RF-PECVD

We present an advanced image analysis study of the 3D surfaces of silver/diamond-like carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical vapour deposition. Atomic force microscopy data were analysed, with the goal to provide image analysis tools allowing for a better und...

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Bibliographic Details
Published inSurface engineering Vol. 36; no. 7; pp. 713 - 719
Main Authors Ţălu, Ştefan, Abdolghaderi, Senour, Pinto, Erveton Pinheiro, Matos, Robert Saraiva, Salerno, Marco
Format Journal Article
LanguageEnglish
Published London, England Taylor & Francis 02.07.2020
SAGE Publications
Subjects
Ag/DLC nanocomposite
atomic force microscopy
fractal dimension
fractal lacunarity
fractal succolarity
surface microtexture
fractal dimension
surface microtexture
fractal succolarity
atomic force microscopy
fractal lacunarity
Ag/DLC nanocomposite
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Summary:We present an advanced image analysis study of the 3D surfaces of silver/diamond-like carbon nanocomposite films prepared by radio-frequency plasma-enhanced chemical vapour deposition. Atomic force microscopy data were analysed, with the goal to provide image analysis tools allowing for a better understanding of the structure-property correlation, with specific case for the present material. While the samples' fractal dimension decreased and the roughness increased with increasing deposition time, fractal succolarity showed no significant difference and relatively high values, describing high percolation, and fractal lacunarity decreased, in agreement with topographic entropy, which revealed uniformity in height distribution. In conclusion, the samples' microtexture shows a nearly uniform surface with a homogenous distribution of nanoparticles, due to the fabrication process and the emerging fractal nature of the nanocomposite, at all the considered deposition times. Fractal lacunarity and succolarity, currently not provided by commercial image analysis programmes, can be useful in advanced surface image characterization.
ISSN:0267-0844
1743-2944
DOI:10.1080/02670844.2019.1710937