Damping and instability in non-contact atomic force microscopy: the contribution of the instrument

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Bibliographic Details
Published inNanotechnology Vol. 16; no. 8; pp. 1346 - 1353
Main Authors Couturier, G, Boisgard, R, Dietzel, D, Aimé, J P
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.08.2005
Institute of Physics
Subjects
Physics
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ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/16/8/061