Suppressing background noise in STED optical nanoscopy

Super-resolution microscopy or optical nanoscopy has enabled all-optical observation of nanoscopic objects with resolution beyond Abbe’s diffraction limit. STimulated Emission Depletion (STED) nanoscopy achieves diffraction-unlimited resolution by employing a de-excitation laser with a hollow core i...

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Bibliographic Details
Published inJournal of the Korean Physical Society Vol. 78; no. 5; pp. 401 - 407
Main Authors Jeong, Sejoo, Kim, Jaeyong, Lee, Jong-Chan
Format Journal Article
LanguageEnglish
Published Seoul The Korean Physical Society 01.03.2021
Springer Nature B.V
한국물리학회
Subjects
Background noise
Depletion
Diffraction
Emissions control
Excitation
Mathematical and Computational Physics
Microscopes
Microscopy
Particle and Nuclear Physics
Physics
Physics and Astronomy
Review
Stimulated emission
Theoretical
물리학
Super-resolution microscopy
Background noise
STED
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Summary:Super-resolution microscopy or optical nanoscopy has enabled all-optical observation of nanoscopic objects with resolution beyond Abbe’s diffraction limit. STimulated Emission Depletion (STED) nanoscopy achieves diffraction-unlimited resolution by employing a de-excitation laser with a hollow core in addition to the conventional excitation laser in confocal microscopy. One of the strong unexpected adverse effects in resolution improvement in STED nanoscopy is a structured, systematic background noise, which deteriorates the desired super-resolved image. Suppressing background noise, therefore, has been an important challenge in STED nanoscopy. Here, we introduce the characteristics of the background noise in STED nanoscopy and review several recent approaches that tackle this problem. The methods will be examined in comparison to one another and the advantages and disadvantages of each method will be highlighted.
ISSN:0374-4884
1976-8524
DOI:10.1007/s40042-021-00057-7