A grounded coplanar waveguide technique for microwave measurement of complex permittivity and permeability

• Published in: IEEE transactions on magnetics Vol. 42; no. 7; pp. 1929 - 1931
• Main Authors: Jiqing Hu, Sligar, A., Chih-Hung Chang, Shih-Lien Lu, Settaluri, R.K.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.07.2006; Institute of Electrical and Electronics Engineers; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Complex permeability; Complex permittivity; conformal mapping; Coplanar waveguides; Cross-disciplinary physics: materials science; rheology; Dielectric materials; Dielectric measurements; Dielectrics; Electromagnetic waveguides; Exact sciences and technology; Frequency; Frequency ranges; full-wave EM simulation; grounded coplanar waveguide; Magnetic materials; Magnetic permeability; Magnetism; Materials science; Microwave measurements; Microwave theory and techniques; Microwaves; Other topics in materials science; Permeability; Permeability measurement; Permittivity measurement; Physics; Thin films; Microwave radiation; Measuring methods; Complex permeability; grounded coplanar waveguide; Simulation; Magnetic permeability; Measurement technique; Waveguides; complex permittivity; conformal mapping; Magnetic materials; full-wave EM simulation; Permittivity; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2006.874098

We present a method for extracting the complex permittivity and permeability of dielectric/magnetic thin films in a grounded coplanar waveguide configuration. The technique is applicable for extraction of these material parameters for lossy and lossless materials over a broad frequency range with high accuracy. For validation, we extracted complex permittivity and permeability, using the scattering parameters obtained from the full-wave electromagnetic simulation for two test cases over a frequency range of 5 to 15 GHz. Accuracy for both dielectric as well as magnetic materials is within 2% error.