Vertical Density Profile Monitoring Using Mixed-effects Model

Profile monitoring is a recent field of research in Statistical Process Control (SPC) literature, which is attracting the interests of many researchers. This approach is used where process data follow a profile and the stability of this functional relationship is checked over time. We consider nonpa...

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Bibliographic Details
Published inProcedia CIRP Vol. 12; pp. 498 - 503
Main Authors Colosimo, B.M., Meneses, M., Semeraro, Q.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 2013
Subjects
Functional Data
Nonparametric mixed-effects
Profile monitoring
Quality
Statistical Process Control (SPC)
Vertical Density Profile
Profile monitoring
Nonparametric mixed-effects
Statistical Process Control (SPC)
Functional Data
Quality
Vertical Density Profile
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Summary:Profile monitoring is a recent field of research in Statistical Process Control (SPC) literature, which is attracting the interests of many researchers. This approach is used where process data follow a profile and the stability of this functional relationship is checked over time. We consider nonparametric mixed effect models for functional data to model the profile. Then, multivariate control charting is applied to identify mean shifts or shape changes in the profile. A real case study dealing with density measurements along the particleboard thickness (usually referred to as Vertical Densit y Profile -VDP) is taken as reference throughout the paper. Performance of the nonparametric approach is computed for a set of out- of-control scenarios. Our main conclusion is that nonparametric methods represent a flexible and effective solution to complex profile monitoring.
ISSN:2212-8271
2212-8271
DOI:10.1016/j.procir.2013.09.085