Localized charge imaging with scanning Kelvin probe microscopy

• Published in: Nanotechnology Vol. 28; no. 2; p. 025703
• Main Authors: Orihuela, M F, Somoza, A M, Colchero, J, Ortuño, M, Palacios-Lidón, E
• Format: Journal Article
• Language: English
• Published: England IOP Publishing 13.01.2017
• Subjects: insulating supports; localized charges; scanning Kelvin probe microscopy

In this work, we propose an intuitive and easily implementable approach to model and interpret scanning Kelvin probe microscopy images of insulating samples with localized charges. The method, based on the image charges method, has been validated by a systematic comparison of its predictions with ex...