Localized charge imaging with scanning Kelvin probe microscopy

In this work, we propose an intuitive and easily implementable approach to model and interpret scanning Kelvin probe microscopy images of insulating samples with localized charges. The method, based on the image charges method, has been validated by a systematic comparison of its predictions with ex...

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Bibliographic Details
Published inNanotechnology Vol. 28; no. 2; p. 025703
Main Authors Orihuela, M F, Somoza, A M, Colchero, J, Ortuño, M, Palacios-Lidón, E
Format Journal Article
LanguageEnglish
Published England IOP Publishing 13.01.2017
Subjects
insulating supports
localized charges
scanning Kelvin probe microscopy
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Summary:In this work, we propose an intuitive and easily implementable approach to model and interpret scanning Kelvin probe microscopy images of insulating samples with localized charges. The method, based on the image charges method, has been validated by a systematic comparison of its predictions with experimental measurements performed on charge domains of different sizes, injected in polymethyl methacrylate discontinuous films. The agreement between predictions and experimental lateral profiles, as well as with spectroscopy tip-sample distance curves, supports its consistency. The proposed procedure allows obtaining quantitative information such as total charge and the size of a charge domain and allows estimating the most adequate measurement parameters.
Bibliography:NANO-112106.R1
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ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/28/2/025703