High-frequency MFM characterization of magnetic recording writer poles

• Published in: Applied physics. A, Materials science & processing Vol. 94; no. 2; pp. 235 - 240
• Main Authors: Koblischka, M. R., Wei, J. D., Sulzbach, T., Hartmann, U.
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.02.2009; Springer
• Subjects: Applied sciences; Carrier frequencies; Characterization and Evaluation of Materials; Condensed Matter Physics; Electronics; Exact sciences and technology; Hafnium; High frequencies; Machines; Magnetic fields; Magnetic recording; Manufacturing; Microscopy; Miscellaneous; Nanotechnology; Optical and Electronic Materials; Physics; Physics and Astronomy; Poles; Processes; Stemming; Storage and reproduction of information; Surfaces and Interfaces; Thin Films; 75.50.Ss; 85.70.Li; 68.37.Rt; Field distribution; Hard disk; High frequency; Magnetic force microscopy; Recording head; Magnetic recording
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-008-4805-7

By means of high-frequency magnetic force microscopy (HF-MFM), different magnetic recording writer poles are characterized in the frequency range 200– 1500 MHz using the dual-vibrational HF-MFM technique. The stray fields emanating from hard disk writer poles stemming from different makers are compared to each other, and the field distributions obtained at different carrier frequencies are analysed. At low carrier frequencies, the maximum field is located directly at the gap, whereas at high frequencies two distinct maxima before and after the gap are observed.