Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong cor...
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| Published in | Applied physics letters Vol. 105; no. 20 |
|---|---|
| Main Authors | , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Melville
American Institute of Physics
17.11.2014
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| Subjects | |
| Online Access | Get full text |
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| Abstract | Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. |
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| AbstractList | Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices. |
| Author | Liu, Hsiang-Lin Li, Lain-Jong Su, Sheng-Han Shen, Chih-Chiang Li, Ming-Yang Hsu, Chang-Lung |
| Author_xml | – sequence: 1 givenname: Hsiang-Lin surname: Liu fullname: Liu, Hsiang-Lin – sequence: 2 givenname: Chih-Chiang surname: Shen fullname: Shen, Chih-Chiang – sequence: 3 givenname: Sheng-Han surname: Su fullname: Su, Sheng-Han – sequence: 4 givenname: Chang-Lung surname: Hsu fullname: Hsu, Chang-Lung – sequence: 5 givenname: Ming-Yang surname: Li fullname: Li, Ming-Yang – sequence: 6 givenname: Lain-Jong surname: Li fullname: Li, Lain-Jong |
| BackLink | https://www.osti.gov/biblio/22391998$$D View this record in Osti.gov |
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| Snippet | Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs).... |
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| SubjectTerms | Applied physics BINDING ENERGY CHALCOGENIDES CHEMICAL VAPOR DEPOSITION CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ELECTRONIC STRUCTURE ELLIPSOMETRY Energy gap L-S COUPLING Monolayers Optical properties OPTOELECTRONIC DEVICES Organic chemistry REFRACTIVE INDEX Refractivity Spectroellipsometry Spectroscopy TRANSITION ELEMENTS Transition metal compounds |
| Title | Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry |
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