Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong cor...

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Published inApplied physics letters Vol. 105; no. 20
Main Authors Liu, Hsiang-Lin, Shen, Chih-Chiang, Su, Sheng-Han, Hsu, Chang-Lung, Li, Ming-Yang, Li, Lain-Jong
Format Journal Article
LanguageEnglish
Published Melville American Institute of Physics 17.11.2014
Subjects
Applied physics
BINDING ENERGY
CHALCOGENIDES
CHEMICAL VAPOR DEPOSITION
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
ELECTRONIC STRUCTURE
ELLIPSOMETRY
Energy gap
L-S COUPLING
Monolayers
Optical properties
OPTOELECTRONIC DEVICES
Organic chemistry
REFRACTIVE INDEX
Refractivity
Spectroellipsometry
Spectroscopy
TRANSITION ELEMENTS
Transition metal compounds
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Summary:Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
Bibliography:ObjectType-Article-1
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ISSN:0003-6951
1077-3118
DOI:10.1063/1.4901836