Reliability analysis using exponentiated Weibull distribution and inverse power law

• Published in: Quality and reliability engineering international Vol. 35; no. 4; pp. 1219 - 1230
• Main Authors: Méndez‐González, Luis Carlos, Rodríguez‐Picón, Luis Alberto, Valles‐Rosales, Delia Julieta, Alvarado Iniesta, Alejandro, Carreón, Abel Eduardo Quezada
• Format: Journal Article
• Language: English
• Published: Bognor Regis Wiley Subscription Services, Inc 01.06.2019
• Subjects: Capacitors; Electronic devices; exponentiated Weibull distribution; Failure analysis; Failure rates; inverse power law; Mean time to failure; nonmonotonic failure rate; Power law; Reliability analysis; Weibull distribution
• ISSN: 0748-8017; 1099-1638
• DOI: 10.1002/qre.2455

Today in reliability analysis, the most used distribution to describe the behavior of devices is the Weibull distribution. Nonetheless, the Weibull distribution does not provide an excellent fit to lifetime datasets that exhibit bathtub shaped or upside‐down bathtub shaped (unimodal) failure rates, which are often encountered in the performance of products such as electronic devices (ED). In this paper, a reliability model based on the exponentiated Weibull distribution and the inverse power law model is proposed, this new model provides a better approach to model the performance and fit of the lifetimes of electronic devices. A case study based on the lifetime of a surface‐mounted electrolytic capacitor is presented in this paper. Besides, it was found that the estimation of the proposed model differs from the Weibull classical model and that affects the mean time to failure (MTTF) of the capacitor under analysis.