Atomically resolved structure of vacuum-heated porous silicon

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Bibliographic Details
Published inJournal of physics. Condensed matter Vol. 12; no. 15; pp. L269 - L274
Main Authors Li, W, Andrienko, I, Haneman, D
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 17.04.2000
Institute of Physics
Subjects
Condensed matter: structure, mechanical and thermal properties
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Physics
Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
Solid surfaces and solid-solid interfaces
Structure of solids and liquids; crystallography
Surface structure and topography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Surface reconstruction
Semiconductor materials
Nonmetals
Porous materials
Silicon
Experimental study
Atomic structure
STM
Heat treatments
Vacuum treatment
Surface structure
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/12/15/102