Excess noise measurement in avalanche photodiodes using a transimpedance amplifier front-end

We report a versatile system for measuring excess noise and multiplication in avalanche photodiodes, using a transimpedance amplifier front-end and based on phase-sensitive detection, which permits accurate measurement in the presence of a high dark current. The system, which we have used successful...

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Bibliographic Details
Published inMeasurement science & technology Vol. 17; no. 7; pp. 1941 - 1946
Main Authors Lau, K S, Tan, C H, Ng, B K, Li, K F, Tozer, R C, David, J P R, Rees, G J
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.07.2006
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Summary:We report a versatile system for measuring excess noise and multiplication in avalanche photodiodes, using a transimpedance amplifier front-end and based on phase-sensitive detection, which permits accurate measurement in the presence of a high dark current. The system, which we have used successfully on a wide variety of materials and device structures, can measure reliably the excess noise factor of devices with a capacitance of up to ~50 pF.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/17/7/036