Facet degradation of GaN heterostructure laser diodes

We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with sufficient oxygen shows a slow degradation. Operation in atmospheres with water vapor causes a fast degradation and an oxidation on the facet....

Full description

Saved in:
Bibliographic Details
Published inJournal of applied physics Vol. 97; no. 12; pp. 123102 - 123102-8
Main Authors Schoedl, Thomas, Schwarz, Ulrich T., Kümmler, Volker, Furitsch, Michael, Leber, Andreas, Miler, Andreas, Lell, Alfred, Härle, Volker
Format Journal Article
LanguageEnglish
Published American Institute of Physics 15.06.2005
Online AccessGet full text

Cover

Loading…
Abstract We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with sufficient oxygen shows a slow degradation. Operation in atmospheres with water vapor causes a fast degradation and an oxidation on the facet. This deposition is a permanent damage to the laser diode. If the laser diode is operated in pure nitrogen, we find a thick deposition on the facet, which shows high absorption. This deposition can be removed by either high optical output powers or by operation in atmospheres with sufficient oxygen. We also explain the influence of these coatings to the degradation behavior and see these coatings as the reason for unstable kinks in the L - I characteristics during operation.
AbstractList We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with sufficient oxygen shows a slow degradation. Operation in atmospheres with water vapor causes a fast degradation and an oxidation on the facet. This deposition is a permanent damage to the laser diode. If the laser diode is operated in pure nitrogen, we find a thick deposition on the facet, which shows high absorption. This deposition can be removed by either high optical output powers or by operation in atmospheres with sufficient oxygen. We also explain the influence of these coatings to the degradation behavior and see these coatings as the reason for unstable kinks in the L–I characteristics during operation.
We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with sufficient oxygen shows a slow degradation. Operation in atmospheres with water vapor causes a fast degradation and an oxidation on the facet. This deposition is a permanent damage to the laser diode. If the laser diode is operated in pure nitrogen, we find a thick deposition on the facet, which shows high absorption. This deposition can be removed by either high optical output powers or by operation in atmospheres with sufficient oxygen. We also explain the influence of these coatings to the degradation behavior and see these coatings as the reason for unstable kinks in the L - I characteristics during operation.
Author Kümmler, Volker
Leber, Andreas
Miler, Andreas
Härle, Volker
Lell, Alfred
Schwarz, Ulrich T.
Schoedl, Thomas
Furitsch, Michael
Author_xml – sequence: 1
  givenname: Thomas
  surname: Schoedl
  fullname: Schoedl, Thomas
  organization: Institut für Angewandte und Experimentelle Physik, Universitätsstrasse 31, 93053 Regensburg, Germany
– sequence: 2
  givenname: Ulrich
  surname: Schwarz
  middlename: T.
  fullname: Schwarz, Ulrich T.
  email: ulrich.schwarz@physik.uni-regensburg.de
  organization: Institut für Angewandte und Experimentelle Physik, Universitätsstrasse 31, 93053 Regensburg, Germany
– sequence: 3
  givenname: Volker
  surname: Kümmler
  fullname: Kümmler, Volker
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
– sequence: 4
  givenname: Michael
  surname: Furitsch
  fullname: Furitsch, Michael
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
– sequence: 5
  givenname: Andreas
  surname: Leber
  fullname: Leber, Andreas
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
– sequence: 6
  givenname: Andreas
  surname: Miler
  fullname: Miler, Andreas
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
– sequence: 7
  givenname: Alfred
  surname: Lell
  fullname: Lell, Alfred
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
– sequence: 8
  givenname: Volker
  surname: Härle
  fullname: Härle, Volker
  organization: OSRAM Opto Semiconductors GmbH, Wernerwerkstrasse 2, 93049 Regensburg, Germany
BookMark eNp1j7FOwzAURS1UJNLCwB94ZUjxi53YXpBQRVukChaYrVf7BYJKgmx34O8JbQcWpitdHV3dM2WTfuiJsWsQcxCNvIU52MqaGs5YAcLYUte1mLBCiApKY7W9YNOUPoQAMNIWrF6ip8wDvUUMmLuh50PLV_jE3ylTHFKOe5_3kfgOE0UeuiFQumTnLe4SXZ1yxl6XDy-Ldbl5Xj0u7jell7XIpQqolPBYGaOb0KDWWlVBSSTboPSaAgUgqyoTtkIqPRbeaNjaRo8Vgpyxm-OuH5-kSK37it0nxm8Hwv36OnAn35G9O7LJd_lg8j98kHZ_pN3Qyh8yIl43
CODEN JAPIAU
CitedBy_id crossref_primary_10_1016_j_microrel_2014_07_073
crossref_primary_10_1002_pssc_200673565
crossref_primary_10_1063_1_2204845
crossref_primary_10_1088_1361_6641_ab74ee
crossref_primary_10_7567_JJAP_56_020302
crossref_primary_10_35848_1347_4065_ac956a
crossref_primary_10_1021_acsami_0c11864
crossref_primary_10_1002_pssc_200674916
crossref_primary_10_1088_0268_1242_30_7_072001
crossref_primary_10_1002_pssr_201700132
crossref_primary_10_1063_1_4990867
crossref_primary_10_1088_1674_1056_17_9_036
crossref_primary_10_1088_1555_6611_ab05be
crossref_primary_10_1063_1_4894831
crossref_primary_10_1109_JPROC_2009_2030826
crossref_primary_10_7567_APEX_11_111002
crossref_primary_10_1002_pssa_202300946
crossref_primary_10_1002_pssa_200824490
crossref_primary_10_1007_s11664_018_6144_6
crossref_primary_10_35848_1882_0786_ab95f0
crossref_primary_10_1063_1_2167400
crossref_primary_10_7567_1347_4065_ab112a
crossref_primary_10_1002_pssr_202100527
crossref_primary_10_1088_1555_6611_ab5587
crossref_primary_10_1557_adv_2016_132
crossref_primary_10_1109_TED_2008_2010602
crossref_primary_10_1049_iet_opt_2018_5110
crossref_primary_10_1063_1_4826254
crossref_primary_10_1016_j_microrel_2010_01_034
crossref_primary_10_3390_photonics8060184
crossref_primary_10_1063_1_3527088
crossref_primary_10_1088_1361_6463_aa9812
crossref_primary_10_1109_LED_2009_2014570
crossref_primary_10_1557_PROC_1195_B01_04
crossref_primary_10_1063_1_4834697
crossref_primary_10_1063_1_3626280
crossref_primary_10_1088_0022_3727_41_13_135115
crossref_primary_10_1007_s13369_014_1483_y
crossref_primary_10_1063_5_0051126
crossref_primary_10_1109_TNANO_2016_2520833
Cites_doi 10.1063/1.326278
10.1063/1.335375
10.1002/1521-396X(200212)194:2<419::AID-PSSA419>3.0.CO;2-B
10.1002/1521-396X(200007)180:1<177::AID-PSSA177>3.0.CO;2-F
10.1063/1.1704861
10.1016/0079-6727(95)00002-X
10.1063/1.347396
10.1109/3.485401
10.1063/1.1734682
10.1063/1.100403
10.1002/pssa.200303325
10.1002/qre.4680080318
10.1557/S1092578300001253
10.1002/pssa.200303322
10.1117/12.529087
ContentType Journal Article
Copyright 2005 American Institute of Physics
Copyright_xml – notice: 2005 American Institute of Physics
DBID AAYXX
CITATION
DOI 10.1063/1.1929851
DatabaseName CrossRef
DatabaseTitle CrossRef
DatabaseTitleList CrossRef

DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1089-7550
EndPage 123102-8
ExternalDocumentID 10_1063_1_1929851
jap
GroupedDBID -DZ
-~X
.DC
186
1UP
2-P
29J
4.4
53G
5GY
5VS
6TJ
85S
AAAAW
AABDS
AAEUA
AAIKC
AAMNW
AAPUP
AAYIH
AAYJJ
ABFTF
ABJNI
ABRJW
ABZEH
ACBEA
ACBRY
ACGFO
ACGFS
ACLYJ
ACNCT
ACZLF
ADCTM
AEGXH
AEJMO
AENEX
AFATG
AFDAS
AFFNX
AFHCQ
AFMIJ
AGKCL
AGLKD
AGMXG
AGTJO
AHSDT
AIAGR
AIDUJ
AJJCW
AJQPL
ALEPV
ALMA_UNASSIGNED_HOLDINGS
AQWKA
ATXIE
AWQPM
BPZLN
CS3
D0L
DU5
EBS
EJD
ESX
F5P
FDOHQ
FFFMQ
HAM
M6X
M71
M73
MVM
N9A
NPSNA
O-B
OHT
P0-
P2P
RIP
RNS
ROL
RQS
RXW
SC5
TAE
TN5
TWZ
UCJ
UHB
UPT
VOH
WH7
XFK
XSW
YQT
YZZ
ZCA
ZCG
~02
AAYXX
BDMKI
CITATION
ID FETCH-LOGICAL-c350t-4da440ca28876d6a77742d43ae96a3c7eded1e9428db03477edc871b96728da13
ISSN 0021-8979
IngestDate Fri Aug 23 01:13:57 EDT 2024
Fri Jun 21 00:18:24 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 12
Language English
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c350t-4da440ca28876d6a77742d43ae96a3c7eded1e9428db03477edc871b96728da13
ParticipantIDs crossref_primary_10_1063_1_1929851
scitation_primary_10_1063_1_1929851Facet_degradation_of
PublicationCentury 2000
PublicationDate 2005-06-15
PublicationDateYYYYMMDD 2005-06-15
PublicationDate_xml – month: 06
  year: 2005
  text: 2005-06-15
  day: 15
PublicationDecade 2000
PublicationTitle Journal of applied physics
PublicationYear 2005
Publisher American Institute of Physics
Publisher_xml – name: American Institute of Physics
References Bader, S. 2000; 180
Itaya, K.; Ishikawa, M.; Okuda, H.; Watanabe, Y.; Nitta, K. 1988; 53
Pavesi, M.; Manfredi, M. 2004; 84
Kümmler, V.; Lell, A.; Härle, V.; Schwarz, U.; Schoedl, T.; Wegscheider, W. 2004; 84
Schoedl, T.; Schwarz, U.; Miller, S.; Furitsch, M.; Leber, A.; Lell, A.; Härle, V. 2004; 201
Makino, T. 1996; 32
Fukuda, M.; Okayasu, M.; Takeshita, T.; Wada, M. 1992; 8
Goto, S.; Ohta, M.; Yabuki, Y.; Hoshina, Y.; Naganuma, K.; Tamamura, K.; Hashizu, T.; Ikeda, M. 2003; 200
Manyakin, F.; Kovalev, A.; Yunovich, A. 1998; 3
Kümmler, V. 2002; 194
Fukuda, M.; Takahei, K. 1985; 57
Okayasu, M.; Fukuda, M.; Takeshita, T.; Uehara, S.; Kurumada, K. 1991; 69
Eliseev, P. 1996; 20
Tomiya, S.; Goto, S.; Takeya, M.; Ikeda, M. 2003; 200
Schwarz, U.; Schoedl, T.; Kümmler, V.; Lell, A.; Härle, V. 2004; 798
Henry, C.; Petroff, P.; Logan, R.; Merritt, F. 1979; 50
Schwarz, U.; Wegscheider, W.; Lell, A.; Härle, V. 2004; 5365
(2023073022571421900_c7) 2004; 84
(2023073022571421900_c19) 1993
(2023073022571421900_c11) 2004; 5365
(2023073022571421900_c5) 1991
(2023073022571421900_c3) 2003; 200
(2023073022571421900_c9) 2000; 180
(2023073022571421900_c10) 2002; 194
(2023073022571421900_c17) 1992; 8
(2023073022571421900_c2) 1998; 3
(2023073022571421900_c6) 1996; 20
(2023073022571421900_c20) 1996; 32
(2023073022571421900_c15) 2004; 201
(2023073022571421900_c12) 1979; 50
(2023073022571421900_c14) 2004; 798
(2023073022571421900_c8) 1988; 53
(2023073022571421900_c13) 2003; 200
(2023073022571421900_c4) 1991; 69
(2023073022571421900_c18) 1995
(2023073022571421900_c1) 2004; 84
(2023073022571421900_c16) 1985; 57
References_xml – volume: 50
  start-page: 3721
  year: 1979
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.326278
  contributor:
    fullname: Henry, C.; Petroff, P.; Logan, R.; Merritt, F.
– volume: 57
  start-page: 129
  year: 1985
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.335375
  contributor:
    fullname: Fukuda, M.; Takahei, K.
– volume: 201
  start-page: 12
  year: 2004
  publication-title: Phys. Status Solidi A
  contributor:
    fullname: Schoedl, T.; Schwarz, U.; Miller, S.; Furitsch, M.; Leber, A.; Lell, A.; Härle, V.
– volume: 194
  start-page: 419
  year: 2002
  publication-title: Phys. Status Solidi A
  doi: 10.1002/1521-396X(200212)194:2<419::AID-PSSA419>3.0.CO;2-B
  contributor:
    fullname: Kümmler, V.
– volume: 180
  start-page: 177
  year: 2000
  publication-title: Phys. Status Solidi A
  doi: 10.1002/1521-396X(200007)180:1<177::AID-PSSA177>3.0.CO;2-F
  contributor:
    fullname: Bader, S.
– volume: 84
  start-page: 2989
  year: 2004
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.1704861
  contributor:
    fullname: Kümmler, V.; Lell, A.; Härle, V.; Schwarz, U.; Schoedl, T.; Wegscheider, W.
– volume: 20
  start-page: 1
  year: 1996
  publication-title: Prog. Quantum Electron.
  doi: 10.1016/0079-6727(95)00002-X
  contributor:
    fullname: Eliseev, P.
– volume: 200
  start-page: 122
  year: 2003
  publication-title: Phys. Status Solidi A
  contributor:
    fullname: Goto, S.; Ohta, M.; Yabuki, Y.; Hoshina, Y.; Naganuma, K.; Tamamura, K.; Hashizu, T.; Ikeda, M.
– volume: 69
  start-page: 8346
  year: 1991
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.347396
  contributor:
    fullname: Okayasu, M.; Fukuda, M.; Takeshita, T.; Uehara, S.; Kurumada, K.
– volume: 798
  start-page: Y11.10.1
  year: 2004
  publication-title: Mater. Res. Soc. Symp. Proc.
  contributor:
    fullname: Schwarz, U.; Schoedl, T.; Kümmler, V.; Lell, A.; Härle, V.
– volume: 32
  start-page: 493
  year: 1996
  publication-title: IEEE J. Quantum Electron.
  doi: 10.1109/3.485401
  contributor:
    fullname: Makino, T.
– volume: 5365
  start-page: 267
  year: 2004
  publication-title: Proc. SPIE
  contributor:
    fullname: Schwarz, U.; Wegscheider, W.; Lell, A.; Härle, V.
– volume: 84
  start-page: 3403
  year: 2004
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.1734682
  contributor:
    fullname: Pavesi, M.; Manfredi, M.
– volume: 3
  start-page: 53
  year: 1998
  publication-title: MRS Internet J. Nitride Semicond. Res.
  contributor:
    fullname: Manyakin, F.; Kovalev, A.; Yunovich, A.
– volume: 8
  start-page: 283
  year: 1992
  publication-title: Qual. Reliab. Eng. Int.
  contributor:
    fullname: Fukuda, M.; Okayasu, M.; Takeshita, T.; Wada, M.
– volume: 200
  start-page: 139
  year: 2003
  publication-title: Phys. Status Solidi A
  contributor:
    fullname: Tomiya, S.; Goto, S.; Takeya, M.; Ikeda, M.
– volume: 53
  start-page: 1363
  year: 1988
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.100403
  contributor:
    fullname: Itaya, K.; Ishikawa, M.; Okuda, H.; Watanabe, Y.; Nitta, K.
– volume: 200
  start-page: 122
  year: 2003
  ident: 2023073022571421900_c13
  publication-title: Phys. Status Solidi A
  doi: 10.1002/pssa.200303325
– volume: 84
  start-page: 3403
  year: 2004
  ident: 2023073022571421900_c1
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.1734682
– volume: 32
  start-page: 493
  year: 1996
  ident: 2023073022571421900_c20
  publication-title: IEEE J. Quantum Electron.
  doi: 10.1109/3.485401
– volume: 8
  start-page: 283
  year: 1992
  ident: 2023073022571421900_c17
  publication-title: Qual. Reliab. Eng. Int.
  doi: 10.1002/qre.4680080318
– volume: 50
  start-page: 3721
  year: 1979
  ident: 2023073022571421900_c12
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.326278
– volume: 69
  start-page: 8346
  year: 1991
  ident: 2023073022571421900_c4
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.347396
– volume-title: Diode Lasers and Photonic Integrated Circuits
  year: 1995
  ident: 2023073022571421900_c18
– volume-title: Semiconductor Lasers
  year: 1993
  ident: 2023073022571421900_c19
– volume: 798
  start-page: Y11
  year: 2004
  ident: 2023073022571421900_c14
  publication-title: Mater. Res. Soc. Symp. Proc.
– volume: 3
  start-page: 53
  year: 1998
  ident: 2023073022571421900_c2
  publication-title: MRS Internet J. Nitride Semicond. Res.
  doi: 10.1557/S1092578300001253
– volume: 194
  start-page: 419
  year: 2002
  ident: 2023073022571421900_c10
  publication-title: Phys. Status Solidi A
  doi: 10.1002/1521-396X(200212)194:2<419::AID-PSSA419>3.0.CO;2-B
– volume: 57
  start-page: 129
  year: 1985
  ident: 2023073022571421900_c16
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.335375
– volume: 53
  start-page: 1363
  year: 1988
  ident: 2023073022571421900_c8
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.100403
– volume: 180
  start-page: 177
  year: 2000
  ident: 2023073022571421900_c9
  publication-title: Phys. Status Solidi A
  doi: 10.1002/1521-396X(200007)180:1<177::AID-PSSA177>3.0.CO;2-F
– volume: 20
  start-page: 1
  year: 1996
  ident: 2023073022571421900_c6
  publication-title: Prog. Quantum Electron.
  doi: 10.1016/0079-6727(95)00002-X
– volume: 201
  start-page: 12
  year: 2004
  ident: 2023073022571421900_c15
  publication-title: Phys. Status Solidi A
– volume: 200
  start-page: 139
  year: 2003
  ident: 2023073022571421900_c3
  publication-title: Phys. Status Solidi A
  doi: 10.1002/pssa.200303322
– volume-title: Reliability and Degradation of Semiconductor Lasers and LEDs
  year: 1991
  ident: 2023073022571421900_c5
– volume: 84
  start-page: 2989
  year: 2004
  ident: 2023073022571421900_c7
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.1704861
– volume: 5365
  start-page: 267
  year: 2004
  ident: 2023073022571421900_c11
  publication-title: Proc. SPIE
  doi: 10.1117/12.529087
SSID ssj0011839
Score 2.0801394
Snippet We investigated the degradation of cleaved facets of (Al,In)GaN laser diodes in different atmospheres. We found that operation in water-free atmospheres with...
SourceID crossref
scitation
SourceType Aggregation Database
Publisher
StartPage 123102
Title Facet degradation of GaN heterostructure laser diodes
URI http://dx.doi.org/10.1063/1.1929851
Volume 97
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dT9swELcGEwIe0FaYBowpmvZWpcROYsePrKKrJoF4aKe-RY7tiI_SIFZpEn89ZztJXQoS8BJFlw9Fd5fzz_bv7hD6GQmhBC8h-pUSJihKlmGmExYWJFMKCwKDvMl3Pjunw3HyZ5JOFtsFNrtkXvTkw7N5Je-xKsjAriZL9g2WbV8KAjgH-8IRLAzHV9l4IKSed5Wp96Ba6PdbnAP8A3VVrjas2SEAiGw6gV9VqqYMrsJRUcNRt9TRIm1TpVOr6RMukbvwX9zb5efxFILpZXfUa6O32X7_1b-9rdMM_1bTmwULeGAa5v1zLah81n6z9pAajpTLvvTo_mK2TGy48L6zyRjAYcZd05iedoE2ynjIUld0tonEjqnbeBzx4io2MJR4o7QTWEuvjgIAu8yCRA_QK8_qerbLRbWvxd0a-kgYT5mle7a0IGwQo6MFuW9uqlHR-Lh94RKG2QSo4lgTHjAZfUI7tQmDE-cen9EHPeugba_OZAdt1MraRal1mcBzmaAqA3CZ4InLBNZlAucye2g8OB31h2HdOSOUcRrN4Z8TSRJJ-NVgsFNUMAD5RCWx0JyKWDKttMKaw9RTFVGcMBBImDkXnDIQCRx_Qeuzaqa_ogCmszQlBS3jKEvKkghCJKZSqYSDTiTeRz8aXeR3rkBKbokNNM5xXitsH7FWSy_fZTWQexrIq_Lg3U8eoq2Fy35D66A_fQQAcl58txZ_BBbFcoU
link.rule.ids 315,786,790,27957,27958,76747
linkProvider American Institute of Physics
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV07T8MwELZQESoMPAqI8rQQa9I4DyceEaIUaDu1UrfIsR1RQE3Upgu_nrOTloDE0tWypcvnyHen--47hO4cziVnKbx-qYAERYrUipQfWokbSUm4C05e9zsPhrQ39l8mwaTi5uheGDBiYfNpbor47zzvVABanxBzLvMfwQHqdYgN4QmLdAP1ttakCQ1zb83wINr5lwwPYkUsZCthofrRX-6oCV6nLIDXfEz3oBykaqwz1JIPe1kktvj6I9y4sfmHaL-KPvF9uf0IbalZC-3VNAlbaMdwQsXiGAVdLlSBpZaTKCcv4SzFT3yI3zSHJiulZ5dzhSECV3Msp5lUixM07j6OHnpWNWXBEl7gFHA_3PcdAdcCD6OkPISA0JW-xxWj3BOhkkoSxSBNkYnj-SEsCMiyEkZDWOLEO0WNWTZTZwhD6kMDN6Gp50R-mrrcdQWhQkqfwQcL0ka3K7DjvBTTiE0RnHoxiSs02ihcX8P_uwwCcQ2BOEvPNz55g5q90aAf95-Hrxdo18iz6vlEwSVqAJbqCgKPIrk2v9c3ri3T4g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Facet+degradation+of+GaN+heterostructure+laser+diodes&rft.jtitle=Journal+of+applied+physics&rft.au=Schoedl%2C+Thomas&rft.au=Schwarz%2C+Ulrich+T.&rft.au=K%C3%BCmmler%2C+Volker&rft.au=Furitsch%2C+Michael&rft.date=2005-06-15&rft.pub=American+Institute+of+Physics&rft.issn=0021-8979&rft.eissn=1089-7550&rft.volume=97&rft.issue=12&rft.spage=123102&rft.epage=123102-8&rft_id=info:doi/10.1063%2F1.1929851&rft.externalDocID=jap
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0021-8979&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0021-8979&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0021-8979&client=summon