Square-extensional mode single-crystal silicon micromechanical resonator for low-phase-noise oscillator applications
A micromechanical 13.1-MHz bulk acoustic mode silicon resonator having a high quality factor (Q=130 000) and high maximum drive level (P= 0.12 mW at the hysteresis limit) is demonstrated. The prototype resonator is fabricated of single-crystal silicon by reactive ion etching of a silicon-on-insulato...
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Published in | IEEE electron device letters Vol. 25; no. 4; pp. 173 - 175 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.04.2004
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | A micromechanical 13.1-MHz bulk acoustic mode silicon resonator having a high quality factor (Q=130 000) and high maximum drive level (P= 0.12 mW at the hysteresis limit) is demonstrated. The prototype resonator is fabricated of single-crystal silicon by reactive ion etching of a silicon-on-insulator wafer. A demonstration oscillator based on the new resonator shows single-sideband phase noise of -138 dBc/Hz at 1 kHz offset from the carrier. |
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AbstractList | A micromechanical 13.1-MHz bulk acoustic mode silicon resonator having a high quality factor (Q=130 000) and high maximum drive level (P= 0.12 mW at the hysteresis limit) is demonstrated. The prototype resonator is fabricated of single-crystal silicon by reactive ion etching of a silicon-on-insulator wafer. A demonstration oscillator based on the new resonator shows single-sideband phase noise of -138 dBc/Hz at 1 kHz offset from the carrier. |
Author | Seppa, H. Kaajakari, V. Mattila, T. Oja, A. Kiihamaki, J. |
Author_xml | – sequence: 1 givenname: V. surname: Kaajakari fullname: Kaajakari, V. organization: VTT Inf. Technol., Espoo, Finland – sequence: 2 givenname: T. surname: Mattila fullname: Mattila, T. organization: VTT Inf. Technol., Espoo, Finland – sequence: 3 givenname: A. surname: Oja fullname: Oja, A. organization: VTT Inf. Technol., Espoo, Finland – sequence: 4 givenname: J. surname: Kiihamaki fullname: Kiihamaki, J. organization: VTT Inf. Technol., Espoo, Finland – sequence: 5 givenname: H. surname: Seppa fullname: Seppa, H. organization: VTT Inf. Technol., Espoo, Finland |
BookMark | eNp9kb1PHDEQxa2ISDkIdYo0KwpE48Nfa3tLRCBEOikFUFuOdxaMdu3FsyfCfx9fDikSRYrRSOPfex7NOyQHKScg5Atna85Zd765-rYWjKm1Fcoq9oGseNtaylotD8iKGcWp5Ex_IoeIT4xxpYxakeX2eesLUPi9QMKYkx-bKffQYEwPI9BQXnGpM4xjDDk1UwwlTxAefYqhzgtg1Sy5NEOtMb_Q-dEj0JQjQpMxxHH8--znuTr4pX6Bn8nHwY8Ix2_9iNxfX91d3tDNz-8_Li82NMiWLVQMvyQI04eOB2NDr5WX0lqttR9aLznXUvg-yK7rvZVCaG-tV30X-MBEsEYekdO971zy8xZwcVPEAHWjBHmLTlitWCvbCp79F-TacGGlMjvPk3foU96WejZ0neB1b2NYhc73UD0WYoHBzSVOvrw6ztwuLVfTcru03D6tqvi6V0QA-EcLY1ul5R9fAJP- |
CODEN | EDLEDZ |
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Cites_doi | 10.1117/12.425337 10.1109/SENSOR.2003.1217080 10.1109/IEDM.2000.904363 10.1109/58.775646 10.1016/S0924-4247(02)00204-2 10.1002/mmce.1039 10.1109/22.780400 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004 |
DBID | RIA RIE AAYXX CITATION 7SP 8FD L7M F28 FR3 |
DOI | 10.1109/LED.2004.824840 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) Online IEL CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Engineering Research Database |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts Engineering Research Database ANTE: Abstracts in New Technology & Engineering |
DatabaseTitleList | Engineering Research Database Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Xplore Digital Library url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1558-0563 |
EndPage | 175 |
ExternalDocumentID | 2585728391 10_1109_LED_2004_824840 1278546 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AFFNX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS TAE TN5 TWZ VH1 XFK AAYXX CITATION 7SP 8FD L7M F28 FR3 |
ID | FETCH-LOGICAL-c350t-2fb3e27dc91c78cd64a3388666af5a311632adc399da83226a88a4d9c1f02c873 |
IEDL.DBID | RIE |
ISSN | 0741-3106 |
IngestDate | Fri Aug 16 22:54:17 EDT 2024 Fri Aug 16 04:09:15 EDT 2024 Fri Sep 13 07:27:13 EDT 2024 Fri Aug 23 01:29:29 EDT 2024 Wed Jun 26 19:20:31 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 4 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c350t-2fb3e27dc91c78cd64a3388666af5a311632adc399da83226a88a4d9c1f02c873 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
PQID | 921350770 |
PQPubID | 23500 |
PageCount | 3 |
ParticipantIDs | proquest_miscellaneous_28640535 proquest_miscellaneous_1671283477 proquest_journals_921350770 crossref_primary_10_1109_LED_2004_824840 ieee_primary_1278546 |
PublicationCentury | 2000 |
PublicationDate | 2004-04-01 |
PublicationDateYYYYMMDD | 2004-04-01 |
PublicationDate_xml | – month: 04 year: 2004 text: 2004-04-01 day: 01 |
PublicationDecade | 2000 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE electron device letters |
PublicationTitleAbbrev | LED |
PublicationYear | 2004 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | quévy quevy (ref10) 2003 ref8 ref7 ref9 ref6 ref5 robins (ref2) 1982 mattila (ref4) 2002; 1 ref1 lee (ref3) 1998 |
References_xml | – ident: ref5 doi: 10.1117/12.425337 – ident: ref7 doi: 10.1109/SENSOR.2003.1217080 – start-page: 157 year: 2003 ident: ref10 article-title: ultimate technology for micromachining of nanometric gap hf micromechanical resonators publication-title: Proc MEMS contributor: fullname: quévy quevy – year: 1982 ident: ref2 publication-title: Phase Noise in Signal Sources (Theory and Applications) contributor: fullname: robins – ident: ref6 doi: 10.1109/IEDM.2000.904363 – ident: ref9 doi: 10.1109/58.775646 – year: 1998 ident: ref3 publication-title: The Design of CMOS Radio-Frequency Integrated Circuits contributor: fullname: lee – volume: 1 start-page: 1 year: 2002 ident: ref4 article-title: 12 mhz micromechanical bulk acoustic mode oscillator publication-title: Sens Actuators A Phys doi: 10.1016/S0924-4247(02)00204-2 contributor: fullname: mattila – ident: ref8 doi: 10.1002/mmce.1039 – ident: ref1 doi: 10.1109/22.780400 |
SSID | ssj0014474 |
Score | 2.215556 |
Snippet | A micromechanical 13.1-MHz bulk acoustic mode silicon resonator having a high quality factor (Q=130 000) and high maximum drive level (P= 0.12 mW at the... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 173 |
SubjectTerms | Acoustic noise Devices Etching Hysteresis Microcavities Micromechanical devices Oscillators Phase noise Q factor Quality factor Reactive ion etching Resonators Scanning electron microscopy Shape Silicon Silicon on insulator technology Single crystals |
Title | Square-extensional mode single-crystal silicon micromechanical resonator for low-phase-noise oscillator applications |
URI | https://ieeexplore.ieee.org/document/1278546 https://www.proquest.com/docview/921350770/abstract/ https://search.proquest.com/docview/1671283477 https://search.proquest.com/docview/28640535 |
Volume | 25 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT9swFH8qnLbDgDG08ulJHDjgkjhObB_RBkLTugsgcYscxxWIkkCbCsFfz3tOWyrGJG6JYieO37Pfp38PYN8F1CmkQCFNwaX0ihcqTTkyz8A6kyJd6HBy_292dil_X6VXHTicn4Xx3ofkM9-jyxDLL2s3IVfZUSyUTmW2BEs6Eu1ZrXnEQMoWcRklJO4rUTaF8Ykjc_Tn5FcwBHtaSE1ejgUJFEqq_LMPB-FyugL92bDanJLb3qQpeu75DWLjR8e9Cl-mWiY7btliDTq--gqfF7AH16E5f0Du8Dx4wVtoDkZlcRg5D4aeu9ETKo5DvB0is1TsLmTueTooTHRlaKaT470eMVR72bB-5PfXKBF5Vd-MPSOITGQwerwYIv8Gl6cnFz_P-LQEA3dJGjVcDIrEC1U6EzulXZlJizatRpvHDlKbxKjNCVs61HJKS3tDZrW2sjQuHkTCaZVswHJVV_47sCIzBrsIb6SVVgiNb0S73BQyshSc7cLBjCz5fYu0kQcLJTI5UpDqZcq8pWAX1mmSX5u189uFrRkZ8-lKHOdGxPgnSmGnH_OnuIQoLmIrX0_GeZwplNKJVKoLe_9pI3QmCQpn8_1Pb8Gn15SebVhuRhO_g9pKU-wGNn0BHTjotA |
link.rule.ids | 315,786,790,802,27957,27958,55109 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT9swFH9i7MA4bONjorANI3HggEviOLF9nDZQBy0XQOIWOY6rTSsJtKnQ9tfvPactFduk3RLFThy_Z79P_x7AoQuoU0iBQpqCS-kVL1SacmSeoXUmRbrQ4eTBZda7kee36e0KHC_OwnjvQ_KZ79JliOWXtZuSq-wkFkqnMnsBL1HOR6Y9rbWIGUjZYi6jjMSdJcpmQD7Y8KR_-iWYgl0tpCY_x5IMCkVV_tiJg3g5ewOD-cDarJIf3WlTdN2vZ5iN_zvyt_B6pmeyTy1jbMCKrzZhfQl9cAuaqwfkD8-DH7wF52BUGIeR-2DkuRv_RNVxhLcjZJeK3YXcPU9HhYmyDA11cr3XY4aKLxvVj_z-G8pEXtXfJ54RSCayGD1eDpJvw83Z6fXnHp8VYeAuSaOGi2GReKFKZ2KntCszadGq1Wj12GFqkxj1OWFLh3pOaWl3yKzWVpbGxcNIOK2Sd7Ba1ZXfAVZkxmAX4Y200gqh8Y1omZtCRpbCsx04mpMlv2-xNvJgo0QmRwpSxUyZtxTswBZN8lOzdn47sDcnYz5bi5PciBj_RCnsdLB4iouIIiO28vV0kseZQjmdSKU6sP-PNkJnksBwdv_-6X1Y610P-nn_6-XFHrx6SvB5D6vNeOo_oO7SFB8Dy_4GhjXsCg |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Square-extensional+mode+single-crystal+silicon+micromechanical+resonator+for+low-phase-noise+oscillator+applications&rft.jtitle=IEEE+electron+device+letters&rft.au=Kaajakari%2C+V.&rft.au=Mattila%2C+T.&rft.au=Oja%2C+A.&rft.au=Kiihamaki%2C+J.&rft.date=2004-04-01&rft.pub=IEEE&rft.issn=0741-3106&rft.eissn=1558-0563&rft.volume=25&rft.issue=4&rft.spage=173&rft.epage=175&rft_id=info:doi/10.1109%2FLED.2004.824840&rft.externalDocID=1278546 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0741-3106&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0741-3106&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0741-3106&client=summon |