Strain distributions and their influence on electronic structures of WSe2–MoS2 laterally strained heterojunctions
Monolayer transition metal dichalcogenide heterojunctions, including vertical and lateral p–n junctions, have attracted considerable attention due to their potential applications in electronics and optoelectronics. Lattice-misfit strain in atomically abrupt lateral heterojunctions, such as WSe 2 –Mo...
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Published in | Nature nanotechnology Vol. 13; no. 2; pp. 152 - 158 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing Group UK
01.02.2018
Nature Publishing Group |
Subjects | |
Online Access | Get full text |
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Summary: | Monolayer transition metal dichalcogenide heterojunctions, including vertical and lateral p–n junctions, have attracted considerable attention due to their potential applications in electronics and optoelectronics. Lattice-misfit strain in atomically abrupt lateral heterojunctions, such as WSe
2
–MoS
2
, offers a new band-engineering strategy for tailoring their electronic properties. However, this approach requires an understanding of the strain distribution and its effect on band alignment. Here, we study a WSe
2
–MoS
2
lateral heterojunction using scanning tunnelling microscopy and image its moiré pattern to map the full two-dimensional strain tensor with high spatial resolution. Using scanning tunnelling spectroscopy, we measure both the strain and the band alignment of the WSe
2
–MoS
2
lateral heterojunction. We find that the misfit strain induces type II to type I band alignment transformation. Scanning transmission electron microscopy reveals the dislocations at the interface that partially relieve the strain. Finally, we observe a distinctive electronic structure at the interface due to hetero-bonding.
Mapping a moiré pattern in a lateral lattice-mismatched WSe
2
–MoS
2
heterojunction enables determination of the full strain tensor and the study of strain-induced electronic properties. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 1748-3387 1748-3395 1748-3395 |
DOI: | 10.1038/s41565-017-0022-x |