High contrast thermal deflectometry using long-wave infrared time modulated integrating cavity source

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Bibliographic Details
Published inOptics express Vol. 27; no. 20; pp. 28660 - 28678
Main Authors Graves, Logan R., Quach, Henry, Koshel, R. John, Oh, Chang-Jin, Kim, Dae Wook
Format Journal Article
LanguageEnglish
Published 30.09.2019
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.27.028660