Stress- and temperature-compensated orientations for thickness-shear langasite resonators for high-temperature and high-pressure environment
This paper describes an exhaustive study of the variations of the mean force sensitivity coefficients in the entire region of crystalline langasite (LGS). We also study the variation of temperature coefficients in the entire region of the crystalline LGS and its isomorphs. The computational results...
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Published in | IEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 62; no. 6; pp. 1095 - 1103 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
IEEE
01.06.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | This paper describes an exhaustive study of the variations of the mean force sensitivity coefficients in the entire region of crystalline langasite (LGS). We also study the variation of temperature coefficients in the entire region of the crystalline LGS and its isomorphs. The computational results have been obtained from a procedure that has been successfully employed in the study of the planar and temperature stress-induced frequency shifts in thickness-mode resonators. Both the fast and slow thickness-shear modes have been studied. Among other things, the loci of orientations with zero stress and temperature coefficients of frequency have been identified for LGS. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0885-3010 1525-8955 |
DOI: | 10.1109/TUFFC.2014.006857 |