Stress- and temperature-compensated orientations for thickness-shear langasite resonators for high-temperature and high-pressure environment

This paper describes an exhaustive study of the variations of the mean force sensitivity coefficients in the entire region of crystalline langasite (LGS). We also study the variation of temperature coefficients in the entire region of the crystalline LGS and its isomorphs. The computational results...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 62; no. 6; pp. 1095 - 1103
Main Authors Patel, Mihir S., Sinha, Bikash K.
Format Journal Article
LanguageEnglish
Published United States IEEE 01.06.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Dielectric constant
Force
Resonant frequency
Stress
Temperature
Temperature measurement
Temperature sensors
Online AccessGet full text

Cover

More Information
Summary:This paper describes an exhaustive study of the variations of the mean force sensitivity coefficients in the entire region of crystalline langasite (LGS). We also study the variation of temperature coefficients in the entire region of the crystalline LGS and its isomorphs. The computational results have been obtained from a procedure that has been successfully employed in the study of the planar and temperature stress-induced frequency shifts in thickness-mode resonators. Both the fast and slow thickness-shear modes have been studied. Among other things, the loci of orientations with zero stress and temperature coefficients of frequency have been identified for LGS.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0885-3010
1525-8955
DOI:10.1109/TUFFC.2014.006857