Integral magnetic field measurement using an automatic fast long-loop-flip coil system

This study describes "static scan" and "dynamic scan" methods to measure the integral magnetic field using a long-loop-flip coil, and to characterize the elliptically polarizing undulator and other insertion device magnets in a synchrotron light source. The basic design concept i...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 52; no. 3; pp. 865 - 870
Main Authors Hwang, C.S., Fu Yuan Lin, Tai-ching Fan
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2003
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Coiling
Coils
Construction
Devices
Dynamical systems
Dynamics
Integrals
Light sources
Magnetic analysis
Magnetic field measurement
Magnets
Microcomputers
Optical polarization
Personal computers
Signal analysis
Synchrotrons
Undulators
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Summary:This study describes "static scan" and "dynamic scan" methods to measure the integral magnetic field using a long-loop-flip coil, and to characterize the elliptically polarizing undulator and other insertion device magnets in a synchrotron light source. The basic design concept is to build a reliable, precise, and fast automatic measurement system for integral magnetic field measurement on the two transverse axes. An advanced analysis method is developed to compensate for the electronic signal drift of the integrator. A multifunction LabView application program was developed on a personal computer main control unit, with Microsoft Windows 3.1-98. Several personal computer slot interface cards communicate with and control the various devices. The system hardware and the theory underlying measurement and analysis are described below.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2003.814674