Variance of the cumulative histogram of ADCs due to frequency errors
The variance in the number of counts of the cumulative histogram, used for the characterization of analog-to-digital converters (ADCs) with the histogram method, is calculated without any restrictions regarding the magnitude of the frequency errors on the stimulus and sampling signals, number of per...
Saved in:
Published in | IEEE transactions on instrumentation and measurement Vol. 52; no. 1; pp. 69 - 74 |
---|---|
Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.02.2003
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | The variance in the number of counts of the cumulative histogram, used for the characterization of analog-to-digital converters (ADCs) with the histogram method, is calculated without any restrictions regarding the magnitude of the frequency errors on the stimulus and sampling signals, number of periods of the stimulus signal, and number of samples. The formulation adopted allows a graphical interpretation of the problem that helps future developments still needed in this particular subject. The exact knowledge of this variance allows for a more efficient test of ADCs and a more precise determination of the uncertainty of the test result. Numerical simulation and experimental results that validate the theory are shown. |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9456 1557-9662 |
DOI: | 10.1109/TIM.2003.809083 |