Variance of the cumulative histogram of ADCs due to frequency errors

The variance in the number of counts of the cumulative histogram, used for the characterization of analog-to-digital converters (ADCs) with the histogram method, is calculated without any restrictions regarding the magnitude of the frequency errors on the stimulus and sampling signals, number of per...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 52; no. 1; pp. 69 - 74
Main Authors Alegria, F.A.C., da Cruz Serra, A.M.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2003
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Analog-digital conversion
Analysis of variance
Counting
Frequency conversion
Histograms
Instrumentation
Mathematical analysis
Mathematical models
Numerical simulation
Permissible error
Probability density function
Sampling
Sampling methods
Testing
Uncertainty
Variance
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Summary:The variance in the number of counts of the cumulative histogram, used for the characterization of analog-to-digital converters (ADCs) with the histogram method, is calculated without any restrictions regarding the magnitude of the frequency errors on the stimulus and sampling signals, number of periods of the stimulus signal, and number of samples. The formulation adopted allows a graphical interpretation of the problem that helps future developments still needed in this particular subject. The exact knowledge of this variance allows for a more efficient test of ADCs and a more precise determination of the uncertainty of the test result. Numerical simulation and experimental results that validate the theory are shown.
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ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2003.809083