Measurement of refractive index distribution of optical waveguides by the propagation mode near-field method employing an improved inverse analysis

A method to estimate the refractive index profile of an optical waveguide exists in which the optical intensity distribution of the only one propagation mode is used. Since this method requires only a microscope and a television camera, setup is extremely simple and inexpensive, thereby making the m...

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Bibliographic Details
Published inElectronics & communications in Japan. Part 2, Electronics Vol. 79; no. 9; pp. 21 - 29
Main Authors Yabu, Tetsuro, Sawa, Shinnosuke, Geshiro, Masahiro
Format Journal Article
LanguageEnglish
Published New York Wiley Subscription Services, Inc., A Wiley Company 1996
Subjects
image measurement
Optical waveguide
refractive index profile
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Summary:A method to estimate the refractive index profile of an optical waveguide exists in which the optical intensity distribution of the only one propagation mode is used. Since this method requires only a microscope and a television camera, setup is extremely simple and inexpensive, thereby making the method practical. The differential processing method and the inverse analysis method have been proposed as methods to use the optical intensity distribution of only one propagation mode. The mechanisms of these methods that use the optical intensity distribution are presented in detail here. As a consequence, a new method that overcomes the difficulties in the previous methods, to be called Improved Inverse Analysis Method with Fewer Parameters, is proposed. Further, by using this proposed method, the index profiles of the step‐index type optical fiber and the buried optical waveguide can be estimated in order for validity of the method to be studied.
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Graduated from the Department of Electronic Engineering, Doshisha University, in 1989 and received his M.S. degree from Kyoto University in 1991. He withdrew from the doctoral program in 1993 and became a Research Associate at Osaka Prefecture University. He has been engaged in research on optical waveguides.
Graduated in 1973 from the Department of Communication Engineering, Osaka University, and received his M.S. and Dr. of Eng. degrees in 1975 and 1978, respectively. In 1979, he became a Research Associate at Ehime University, where he was promoted to an Associate Professor in 1984. In 1986–87, he was on leave at the University of Texas at Austin. In 1994, he became an Associate Professor at Osaka Prefecture University. He has been engaged in research on optics and millimeter wave and microwave waveguides. He is a member of IEEE.
Graduated from the Department of Electrical Engineering, Osaka Prefecture, in 1962 and joined Mitsubishi Electric, remaining there until he left in 1964. He received his M.S. He received his M.S. and Dr. of Eng. degrees from Osaka University in 1967 and 1970, respectively. In 1970, he became an Associate Professor at Ehime University in the Department of Electronic Engineering, where he was promoted to Professor in 1976. In 1991, he became Professor of Osaka Prefecture University in the Department of Electrical Engineering, and, in 1993, Professor in the Department of Electrical and Electronic Systems Engineering. He has been engaged in research on optical waveguides, optical integrated circuits, optical fibers, and planar antennas. He is a member of IEEE; Laser Society; and the Institute of Electrical Engineers of Japan.
ISSN:8756-663X
1520-6432
DOI:10.1002/ecjb.4420790903