Dielectric function of wurtzite GaN and AlN thin films

Measurements and calculations of the dielectric function of wurtzite GaN and AlN are presented. Spectroscopic ellipsometry was used to determine ϵ( ω) of thin film samples in the energy range from 3 to 9.8 eV. Calculations of ϵ( ω) for the bulk materials were performed within a first-principles elec...

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Bibliographic Details
Published inSolid state communications Vol. 112; no. 3; pp. 129 - 133
Main Authors Benedict, L.X., Wethkamp, T., Wilmers, K., Cobet, C., Esser, N., Shirley, E.L., Richter, W., Cardona, M.
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 01.09.1999
Elsevier
Subjects
A. Semiconductors
Condensed matter: electronic structure, electrical, magnetic, and optical properties
D. Electronic band structure
D. Optical properties
E. Synchrotron radiation
Exact sciences and technology
Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Physics
E. Synchrotron radiation
D. Electronic band structure
D. Optical properties
A. Semiconductors
Thin films
Electron-hole coupling
Dielectric function
Inorganic compounds
Spectroscopic ellipsometry
Gallium nitrides
Aluminium nitrides
Binary compounds
Experimental study
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Summary:Measurements and calculations of the dielectric function of wurtzite GaN and AlN are presented. Spectroscopic ellipsometry was used to determine ϵ( ω) of thin film samples in the energy range from 3 to 9.8 eV. Calculations of ϵ( ω) for the bulk materials were performed within a first-principles electronic structure scheme that includes the electron–hole interaction. The agreement between experiment and theory is dramatically improved over the previous work, a result of improvements in both experimental technique and theoretical description. The predicted polarization dependence of the dielectric function of these materials exhibits features similar to that in other wurtzite structure materials.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0038-1098
1879-2766
DOI:10.1016/S0038-1098(99)00323-3