Dark-field Z-scan technique with highly nonlinear absorbing materials: Application to porphyrins

The newly introduced imaging Dark-field Z-scan (DFZ-scan) technique is applied here to demonstrate its ability to measure the optical third-order nonlinear (NL) index coefficient in the presence of nonlinear absorption (NLA). We present our experimental results for two compounds of Porphyrin molecul...

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Bibliographic Details
Published inJournal of nonlinear optical physics & materials Vol. 25; no. 2; p. 1650020
Main Authors Chniti, Meherzia, Cassagne, Christophe, Wang, Hongzhen, Boudebs, Georges
Format Journal Article
LanguageEnglish
Published Singapore World Scientific Publishing Company 01.06.2016
World Scientific Publishing Co. Pte., Ltd
World Scientific Publishing
Subjects
Absorption
Engineering Sciences
Optics
Photonic
Physics
Porphyrins
Signal processing
nonlinear optical properties
Z-scan
porphyrins
Dark-field microscopy
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Summary:The newly introduced imaging Dark-field Z-scan (DFZ-scan) technique is applied here to demonstrate its ability to measure the optical third-order nonlinear (NL) index coefficient in the presence of nonlinear absorption (NLA). We present our experimental results for two compounds of Porphyrin molecules, known to have relatively high NLA in the picosecond regime, at 532 nm, allowing to test both cases of positive and negative nonlinear refraction (NLR). Moreover, we show that, it is possible to increase the sensitivity of the method by introducing a circular aperture in the image plane. Also, limitations are discussed to process optically a pure NL refractive signal, not subject to the influence of the NLA one, at the output of the imaging setup.
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ISSN:0218-8635
1793-6624
DOI:10.1142/S021886351650020X