Analysis of thin copper film planar lines with fractal structure for microwave circuits

We propose modifying the spectral‐domain approach to analyze planar lines with a very thin copper strip, presenting a fractal character. We derive, from a fractional derivative electromagnetism formulation, a new modified surface impedance introduced in that numerical technique. The results exhibit...

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Bibliographic Details
Published inMicrowave and optical technology letters Vol. 12; no. 4; pp. 221 - 224
Main Authors Lepage, P., Pribetich, P.
Format Journal Article
LanguageEnglish
Published New York Wiley Subscription Services, Inc., A Wiley Company 01.07.1996
Subjects
Fractal structure
microwave circuits
transmission line
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Summary:We propose modifying the spectral‐domain approach to analyze planar lines with a very thin copper strip, presenting a fractal character. We derive, from a fractional derivative electromagnetism formulation, a new modified surface impedance introduced in that numerical technique. The results exhibit very sensitive evolution of the losses and of the relative effective permittivity versus frequency. ©1996 John Wiley & Sons, Inc.
Bibliography:ArticleID:MOP12
istex:CACE1C63224EC6E2BA43DCFCC62D5FCE09065C1D
ark:/67375/WNG-R0N2NDJZ-9
ISSN:0895-2477
1098-2760
DOI:10.1002/(SICI)1098-2760(199607)12:4<221::AID-MOP12>3.0.CO;2-D