Evaluation of a scanning transmission x-ray microscope using undulator radiation at the SERC Daresbury Laboratory

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Bibliographic Details
Published in	Journal of physics. E, Scientific instruments Vol. 22; no. 4; pp. 234 - 238
Main Authors	Kenney, J M, Morrison, G R, Browne, M T, Buckley, C J, Burge, R E, Cave, R C, Charalambous, P S, Duke, P J, Hare, A R, Hills, C P B, Michette, A G, Ogawa, K, Rogoyski, A M
Format	Journal Article
Language	English
Published	London IOP Publishing 01.04.1989 New York, NY Institute of Physics American Institute of Physics
Subjects	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
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ISSN:	0022-3735
DOI:	10.1088/0022-3735/22/4/006