An investigation of the error of the background schlieren method

The principle of the background oriented schlieren (BOS) method and its chief areas of applications are considered. An algorithm that generates background patterns and the features in the adaptation of the parameters of the patterns to the conditions of a particular experiment are presented. The inf...

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Bibliographic Details
Published inMeasurement techniques Vol. 52; no. 12; pp. 1300 - 1305
Main Authors Yevtikhiyeva, O. A., Skornyakova, N. M., Udalov, A. V.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.12.2009
Springer Nature B.V
Subjects
Acoustics
Aircraft
Algorithms
Analytical Chemistry
Characterization and Evaluation of Materials
Computer simulation
Digital cameras
Digital imaging
Gases
Investigations
Measurement Science and Instrumentation
Measurement techniques
Personal computers
Physical Chemistry
Physics
Physics and Astronomy
Studies
Visualization
digital image registration
gradient of indices of refraction
background pattern generation
background oriented schlieren method
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Summary:The principle of the background oriented schlieren (BOS) method and its chief areas of applications are considered. An algorithm that generates background patterns and the features in the adaptation of the parameters of the patterns to the conditions of a particular experiment are presented. The influence of the basic parameters of the particular plant on the method is investigated by means of computer simulation as well as experimentally.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-010-9437-6