Study of plastic deformation modes in zirconium by color image analysis

Twinning, as a deformation mode, is a complement to slip. This paper deals with the study from a qualitative point of view, as well as from a quantitative one. Besides techniques widely used in materials science studies such as electron backscattered diffraction (EBSD) or X-ray diffraction (XRD), co...

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Bibliographic Details
Published inJournal of materials processing technology Vol. 153-154; pp. 281 - 287
Main Authors Dussieux, A., Gouton, P., Buy, F., Voltz, C.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 10.11.2004
Subjects
Colour edge detection
EBSD technique
Twinning
Vectorial based segmentation
EBSD technique
Colour edge detection
Twinning
Vectorial based segmentation
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Summary:Twinning, as a deformation mode, is a complement to slip. This paper deals with the study from a qualitative point of view, as well as from a quantitative one. Besides techniques widely used in materials science studies such as electron backscattered diffraction (EBSD) or X-ray diffraction (XRD), colour image analysis technique are presented here. Its results manage to confirm or complete the ones obtained, thanks to others methods.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0924-0136
DOI:10.1016/j.jmatprotec.2004.04.295