XPS investigation of CdTe surfaces: effect of Ru modification

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Bibliographic Details
Published inSemiconductor science and technology Vol. 4; no. 10; pp. 866 - 870
Main Authors Bose, D N, Hedge, M S, Basu, S, Mandal, K C
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.10.1989
Institute of Physics
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Chemical composition
Surface
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/4/10/006