Investigation of interface defects in nanocrystalline SnO2 by positron annihilation

• Published in: The Journal of physics and chemistry of solids Vol. 60; no. 2; pp. 189 - 193
• Main Authors: SHEK, C. H, LAI, J. K. L, LIN, G. M
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier 01.02.1999
• Subjects: Clusters, nanoparticles, and nanocrystalline materials; Condensed matter: structure, mechanical and thermal properties; Defects and impurities in crystals; microstructure; Exact sciences and technology; Microscopic defects (voids, inclusions, etc.); Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals; Physics; Point defects (vacancies, interstitials, color centers, etc.) and defect clusters; Structure of solids and liquids; crystallography; Grain size; Annealing; Inorganic compounds; Vacancies; Grain growth; Positron annihilation; Surface diffusion; Experimental study; Voids; Tin oxides; Interface structure; Defect structure; Microstructure; Nanocrystal
• ISSN: 0022-3697; 1879-2553
• DOI: 10.1016/s0022-3697(98)00269-8