The growth kinetics of intermetallic layers at the interface of a solid metal and a liquid solder
During soldering, intermetallic layers can occur at the interface of a solid metal and the saturated or undersaturated solder melt. In systems with a considerable solubility in the liquid state, dissolution causes a manifold drop in layer thickness. Mathematical equations are proposed to evaluate th...
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Published in | JOM (1989) Vol. 61; no. 1; pp. 76 - 79 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
Boston
Springer US
2009
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | During soldering, intermetallic layers can occur at the interface of a solid metal and the saturated or undersaturated solder melt. In systems with a considerable solubility in the liquid state, dissolution causes a manifold drop in layer thickness. Mathematical equations are proposed to evaluate the thickness of any intermetallic layer formed under conditions of simultaneous dissolution in the undersaturated solder melt. The main features of reactive phase formation at the solid metalliquid solder interface are illustrated using the Co-Sn couple with the growing CoSn
3
(250°C) and CoSn
2
(350°C and 450°C) layers as examples. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1047-4838 1543-1851 |
DOI: | 10.1007/s11837-009-0015-9 |