A Physical Approach of MNOS LSI Memory Testing

User-oriented retention test programs for MNOS LSI memories with built-in test modes have been developed. Their application is demonstrated on the 4 kbit Word Alterable Read Only Memory (WAROM) ER 3400 in a qualification inspection by Bofors Aerotronics. Of particular interest in this program is the...

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Bibliographic Details
Published inPhysica scripta Vol. 24; no. 2; pp. 427 - 429
Main Author Jeppson, Kjell O
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.08.1981
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Summary:User-oriented retention test programs for MNOS LSI memories with built-in test modes have been developed. Their application is demonstrated on the 4 kbit Word Alterable Read Only Memory (WAROM) ER 3400 in a qualification inspection by Bofors Aerotronics. Of particular interest in this program is the retention time, read disturb and endurance to repeated reprogramming. It is shown that repeated write/erase cycling causes significant deterioration in both retention and readability after 105W/E cycles.
ISSN:1402-4896
0031-8949
1402-4896
DOI:10.1088/0031-8949/24/2/018