Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder
A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We...
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Published in | Bulletin of the Korean Chemical Society Vol. 34; no. 3; pp. 788 - 792 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
대한화학회
20.03.2013
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Subjects | |
Online Access | Get full text |
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Summary: | A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard. KCI Citation Count: 2 |
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Bibliography: | http://journal.kcsnet.or.kr/main/j_search/j_abstract_view.htm?code=B130319&qpage=j_search&spage=b_bkcs&dpage=ar G704-000067.2013.34.3.006 |
ISSN: | 0253-2964 1229-5949 |
DOI: | 10.5012/bkcs.2013.34.3.788 |