X-ray generation by inverse Compton scattering at the superconducting RF test facility

Quasi-monochromatic X-rays with high brightness have a broad range of applications in fields such as life sciences, bio-, medical applications, and microlithography. One method for generating such X-rays is via inverse Compton scattering (ICS). X-ray generation experiments using ICS were carried out...

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Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 772; pp. 26 - 33
Main Authors Shimizu, Hirotaka, Akemoto, Mitsuo, Arai, Yasuo, Araki, Sakae, Aryshev, Alexander, Fukuda, Masafumi, Fukuda, Shigeki, Haba, Junji, Hara, Kazufumi, Hayano, Hitoshi, Higashi, Yasuo, Honda, Yosuke, Honma, Teruya, Kako, Eiji, Kojima, Yuji, Kondo, Yoshinari, Lekomtsev, Konstantin, Matsumoto, Toshihiro, Michizono, Shinichiro, Miyoshi, Toshinobu, Nakai, Hirotaka, Nakajima, Hiromitsu, Nakanishi, Kota, Noguchi, Shuichi, Okugi, Toshiyuki, Sato, Masato, Shevelev, Mikhail, Shishido, Toshio, Takenaka, Tateru, Tsuchiya, Kiyosumi, Urakawa, Junji, Watanabe, Ken, Yamaguchi, Seiya, Yamamoto, Akira, Yamamoto, Yasuchika, Sakaue, Kazuyuki, Hosoda, Seiichi, Iijima, Hokuto, Kuriki, Masao, Tanaka, Ryuta, Kuramoto, Ayaka, Omet, Mathieu, Takeda, Ayaki
Format Journal Article
LanguageEnglish
Published 01.02.2015
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Summary:Quasi-monochromatic X-rays with high brightness have a broad range of applications in fields such as life sciences, bio-, medical applications, and microlithography. One method for generating such X-rays is via inverse Compton scattering (ICS). X-ray generation experiments using ICS were carried out at the superconducting RF test facility (STF) accelerator at KEK. A new beam line, newly developed four-mirror optical cavity system, and new X-ray detector system were prepared for experiments downstream section of the STF electron accelerator. Amplified pulsed photons were accumulated into a four-mirror optical cavity and collided with an incoming 40 MeV electron beam. The generated X-rays were detected using a microchannel plate (MCP) detector for X-ray yield measurements and a new silicon-on-insulator (SOI) detector system for energy measurements. The detected X-ray yield by the MCP detector was 1756.8 plus or minus 272.2 photons/(244 electron bunches). To extrapolate this result to 1 ms train length under 5 Hz operations, 4.6010 super(5) photons/1%-bandwidth were obtained. The peak X-ray energy, which was confirmed by the SOI detector, was 29 keV, and this is consistent with ICS X-rays.
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ISSN:0168-9002
DOI:10.1016/j.nima.2014.10.080