Studies of the composition, ion-induced reduction and preferential sputtering of anodic oxide films on Hg0.8Cd0.2Te by XPS

Saved in:
Bibliographic Details
Published inSurface science Vol. 135; no. 1-3; pp. 225 - 242
Main Authors CHRISTIE, A. B, SUTHERLAND, I, WALLS, J. M
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier Science 01.12.1983
Amsterdam
New York, NY
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Solid-fluid interfaces
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Chemical reduction
Photoelectron spectrum
Cadmium Mercury II Tellurides Mixed
Transition metal Compounds
X ray
Experimental study
Anodization
Surface treatment
Inorganic compound
Thin film
Online AccessGet full text

Cover

More Information
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(83)90220-0