Optical Microscopy in the Nano-World

Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photoc...

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Published inChimia Vol. 51; no. 10
Main Authors Dieter W. Pohl, Bettina Nechay, Lukas Novotny, Michael Pfeiffer, Claude Philipona, Taras Plakhotnik, Alois Renn, Abdeljalil Sayah, Joao-Manuel Segura, Beate Sick, Uwe Siegner, Guido Tarrach, Rüdiger Vahldieck, Urs P. Wild, Dieter Zeisel, Alfred J. Meixner, Olivier J.F. Martin, Fabienne Marquis-Weible, Hermann Bach, Martin A. Bopp, Volker Deckert, Pierre Descouts, Rolf Eckert, Hans-Joachim Güntherodt, Christian Hafner, Bert Hecht, Harry Heinzelmann, Thomas Huser, Mark Jobin, Ursula Keller, Thilo Lacoste, Patrick Lambelet, Renato Zenobi
Format Journal Article
LanguageEnglish
Published Swiss Chemical Society 01.10.1997
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Summary:Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland.
ISSN:0009-4293
2673-2424
DOI:10.2533/chimia.1997.760