XPS in industry—Problems with binding energies in journals and binding energy databases

Experimentally measured BEs are commercially available in various forms, e.g. scientific journals, handbooks, internet based data-banks, computer-based data-banks of BEs or complete sets of actual spectra. This review addresses fundamental problems that exist in experimentally measured binding energ...

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Bibliographic Details
Published inJournal of electron spectroscopy and related phenomena Vol. 231; pp. 75 - 87
Main Author Crist, B. Vincent
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.02.2019
Subjects
Binding energy
Calibration energy
Data-bank
ESCA
Measured BEs
NIST
Problem
Reliability
XPS
Calibration energy
Measured BEs
BE
Binding energy
NIST
XPS
Problem
Reliability
ESCA
Data-bank
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Summary:Experimentally measured BEs are commercially available in various forms, e.g. scientific journals, handbooks, internet based data-banks, computer-based data-banks of BEs or complete sets of actual spectra. This review addresses fundamental problems that exist in experimentally measured binding energies (BEs) stored in various numerical X-ray Photoelectron Spectroscopy (XPS) data-banks, including, for example: (1) PHI Handbook of XPS (1979), (2) NIST SRD-20 XPS Database, v1.0–4.1 (1989–2017), (3) Wiley Practical Surface Analysis 1st and 2nd ed. (1990), (4) SASJ ComPro v12 and Data-bank (1990–2017), (5) JEOL Handbook of XPS (1991), (6) CRC Practical Handbook of Spectroscopy (1991), (7) PHI Handbook of XPS, 2nd Ed. (1992), (8) AVS Surface Science Spectra (1993–2017), (9) LaSurface Web Site Database – XPS (2001–2017), and (10) Biesinger XPSfitting website (2012–2017). The 3 major problems in all existing data-banks are due to: (a) the widespread use of different calibration energies, (b) the widespread use of different energy scales, and (c) the widespread use of a “user-defined” BE for the C 1s peak attributed to hydrocarbon moieties. At the end of this review there is a list of recommendations for the design and content of future XPS data-banks.
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2018.02.005