Interfacial Reactions Between In-Sn Solder and Ni-Fe Platings

Interfacial interactions in a Ni- x Fe-Sn-In eutectic solder ( x  = 30 at.%, 55 at.%) have been examined. Transmission and scanning electron microscopy (TEM/SEM) were utilized to investigate the structure, composition, and morphology of the intermetallic compounds (IMCs). Upon reflow, Ni 3 Sn 4 and...

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Bibliographic Details
Published inJournal of electronic materials Vol. 38; no. 12; pp. 2506 - 2515
Main Authors Daghfal, John P., Shang, P. J., Liu, Z. Q., Shang, J. K.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Boston Springer US 01.12.2009
Springer
Springer Nature B.V
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Summary:Interfacial interactions in a Ni- x Fe-Sn-In eutectic solder ( x  = 30 at.%, 55 at.%) have been examined. Transmission and scanning electron microscopy (TEM/SEM) were utilized to investigate the structure, composition, and morphology of the intermetallic compounds (IMCs). Upon reflow, Ni 3 Sn 4 and FeSn 2 phases appeared at the interface along with Cu 6 Sn 5 in the solder. Annealing experiments revealed the formation of a bilayer IMC that was Fe-rich adjacent to the Ni-Fe metallization and Ni-rich on the solder side. Kinetic studies established the apparent activation energies for both systems to be 51.8 kJ/mol and 85.1 kJ/mol, for 30 at.% and 55 at.% Fe contents, respectively. In the Fe-rich system, globular Ni 3 Sn 4 crystals were formed upon reflow, but were changed into a cubic/faceted structure after annealing.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-009-0896-y