Ferroelectric properties of sol-gel derived Nd-doped SrBi4Ti4O15 thin films

• Published in: Journal of rare earths Vol. 26; no. 4; pp. 575 - 578
• Main Author: 范素华 张丰庆 王培吉 任艳霞
• Format: Journal Article
• Language: English
• Published: Department of Materials Science and Engineering, Shandong Jianzhu University, Jinan 250101, China%Department of Science, University of Jinan, Jinan 250022, China%Jiyuan Vocational and Technical College, Jiyuan 454650, China 01.08.2008
• Subjects: 溶胶-凝胶法; 铁电体; SrBi4-xNdxTi4O15 thin films; ferroelectric properties; sol-gel method; rare earths
• ISSN: 1002-0721; 2509-4963
• DOI: 10.1016/S1002-0721(08)60140-4

Neodymium-doped strontium bismuth titanate （SrBi4-xNdxTi4O15） ferroelectric thin films were fabricated using the sol-gel method on Pt/Ti/SiO2/Si substrates. The influence of Nd content on the microstructure and ferroelectric properties of SrBi4-xNdxTi4O15 thin films were systematically studied. The results indicated that the SrBi3.88Nd0.12Ti4O15 （SBNT0.12） thin films had better ferroelectric properties, with a remanent polarization of （2Pr） of 34.3 μC/cm^2 and a coercive field （2Ec） of 220 kV/cm. This could be attributed to the fact that SBNT0.12 ferroelectric thin films consisted of more and larger ball-like grains, approximately 150-200 nm, with structure distortion, which greatly contributed to the improvement of the ferroelectric properties of the films. Furthermore, the film exhibited a good fatigue resistant property. The value of 2Pr after 10^10 switching cycles did not change significantly. The SrBi3.88Nd0.12Ti4O15 films were promising candidates for the application of FeRAMs.