Length-scale-based hardening model for ultra-small volumes

Understanding the hardening response of small volumes is necessary to completely explain the mechanical properties of thin films and nanostructures. This experimental study deals with the deformation and hardening response in gold and copper films ranging in thickness from 10 to 400 nm and silicon n...

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Published inJournal of materials research Vol. 19; no. 10; pp. 2812 - 2821
Main Authors Jungk, J.M., Mook, W.M., Cordill, M.J., Chambers, M.D., Gerberich, W.W., Bahr, D.F., Moody, N.R., Hoehn, J.W.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.10.2004
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Summary:Understanding the hardening response of small volumes is necessary to completely explain the mechanical properties of thin films and nanostructures. This experimental study deals with the deformation and hardening response in gold and copper films ranging in thickness from 10 to 400 nm and silicon nanoparticles with particle diameters less than 100 nm. For very thin films of both gold and copper, it was found that hardness initially decreases from about 2.5 to 1.5 GPa with increasing penetration depth. Thereafter, an increase occurs with depths beyond about 5–10% of the film thickness. It is proposed that the observed minima are produced by two competing mechanisms. It is shown that for relatively deep penetrations, a dislocation back stress argument reasonably explains the material hardening behavior unrelated to any substrate composite effect. Then, for shallow contacts, a volume-to-surface length scale argument relating to an indentation size effect is hypothesized. A simple model based on the superposition of these two mechanisms provides a reasonable fit to the experimental nanoindentation data.
Bibliography:ArticleID:08670
istex:72AD454FB3DE7C7F608A3D834BDF182E20966205
PII:S0884291400086702
ark:/67375/6GQ-S8QG3K4F-R
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0884-2914
2044-5326
DOI:10.1557/JMR.2004.0384